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ATOMIC FORCE MICROSCOPY  —  AFM

ATOMIC FORCE MICROSCOPY — AFM

 

Description

Atomic force microscopy (AFM)  is a very high-resolution, high-sensitive type of scanning probe microscopy capable of quantifying surface roughness down to angstrom-scale. It can performs qualitative mapping of physical properties, like electric fields, adhesion layers, dopant distribution, conductivity region, Thinfilm layer etc.

•Three-dimensional surface topographic imaging
•surface roughness, grain size, step height, and pitch
•Imaging of other sample characteristics, likes magnetic field, capacitance, friction, and phase.

AFM data

 

Our analysis method is accordance to international standard:

ASTM E2859 (Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy)

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