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ELECTRON BACKSCATTER DIFFRACTION —  EBSD

ELECTRON BACKSCATTER DIFFRACTION — EBSD

 

Description

Electron backscatter diffraction (EBSD) is an advance technique generally used with the Scanning Electron Microscope(SEM).  It provides quantitative micro-structural information about the crystallographic nature of semiconductor, metal, mineral, ceramic and even inorganic crystalline material. EBSD uses beam to unveal grain size, grain boundary character and orientation, texture, and phase identity of the specimen. Following are some typical applications:

•Crystal orientation mapping.
•Defect studies
•Phase identification
•Grain boundary and morphology studies
•Regional heterogeneity investigations

EBSD data

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