Electron Energy Loss Spectroscopy (EELS) is a high-sensitivity, non-destructive technique (NDT) for analysing surface and low-energy electronic excitation. It collects more signals than EDS and is ideal for Elemental identification and mapping. EELS is commonly used with STEM to provide elemental information on the Nanometer Scale.
With the advantage of better signal detection, less sensitive to noise and greater spatial resolution at 1nm, EELS is specially useful for N/Si/C/O analysis. Although the equipment is usually takes longer to set up and at times require several set ups, but our experience can overcome those issues.