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fa lab service
FIELD EMISSION  SCANNING ELECTRON MICROSCOPY —  FESEM

FIELD EMISSION SCANNING ELECTRON MICROSCOPY — FESEM

 

Description

Field Emission Scanning Electron Microscope (FE-SEM) has strong electron source coupled with smaller beam size than a typical SEM. This will magnified magnification of imaging up to 500K times. FE-SEM at Labs-Services is capable of performing high resolution imaging with very low accelerating voltages. With these advantages, observations of super fine features, electron beam sensitive materials, as well as non-conductive materials can be easily achieved.

Applications:

  • Ideal microscopic imaging for polymer and thin films.
  • Fine corrosion evaluations.
  • Micro-structure studies best suitable for R&D
  • Detail specimen features' characterisation.
  • Surface contamination elemental analysis
  • Material analysis for component layers
  • FA on PCB

FESEM data

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