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SCANNING TRANSMISSION ELECTRON MICROSCOPY —  STEM

SCANNING TRANSMISSION ELECTRON MICROSCOPY — STEM

 

Description

Scanning Transmission Electron Microscope (STEM) is similar to TEM.  It is a process where pre-specimen lenses focus the beam into a small probe that is scanned in a raster pattern across the specimen. Yet the difference for STEM is that it operates by focusing the electron beam into a narrow spot which is scanned over the sample in a raster. Hence the result of the beam across the given area makes these method suitable for mapping by EDS/EDX spectroscopy, or Electron Energy Loss Spectroscopy (EELS) and .  STEM has the advantage of detecting several signals in parallel which is most suitable for beam sensitive samples, such as catalysts.  Below is an image example:

STEM data

 

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