Service Request

Your request is very important to us.
We will get back to you as soon as we receive your request.
Be sure to select SUBMIT at the end. Thank You.

* Input Required

Title

First or Middle Name *

Last Name *

Company *

Profession *

E-mail Address *

Cell Phone / Work Phone Number *

Returning Customer *

YesNoYes - now at new company


How did you learn about us?

Work ColleagueWeb SearchTrade ShowYour BossA FriendAlready a Customer


How soon do you need results? *

Today<24 hr (1 business day)<48 hr (2 business days)<72 hr (3 business days)4-5 business days1-2 weeks


Type of Service Work Needed (may select more than 1) *

Atomic Absorption Spectroscopy (AAS)Atomic Force Microscopy (AFM)Auger Electron Spectroscopy (AES)Confocal Scanning Acoustic Microscopy (CSAM)Decapsulation (DECAP)Dye and Pry (DP)Electron Backscatter Diffraction (EBSD)Electron Energy Loss Spectroscopy (EELS)Energy Dispersive X-Ray Spectroscopy (EDS)Field Emission Scanning Electron Microscope (FESEM)Focused Ion Beam (FIB)Fourier Transform Infrared Spectroscopy (FTIR)Gas Chromatography Mass Spectrometry (GC-MS)Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES)Inductively Coupled Plasma Mass Spectroscopy (ICP-MS)Ion milling (IM)Magnetic Current Imaging (MCI)Optical Beam Induced Resistance Change (OBIRCH)Photon Emission Microscopy (PEM)Raman Spectroscopy (RAMAN)Reactive Ion Etching (RIE)Scanning Electron Microscopy (SEM)Scanning Transmission Electron Microscopy (STEM)Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)Transmission Electron Microscopy (TEM)X-Ray Photoelectron Spectroscopy(XPS)X-ray Diffraction Analysis (XRD)X-ray Fluorescence Analysis (XRF)2D/3D X-ray (X-Ray)Others ~ Please Specify below at the analysis needs


May we cut the sample to a size that fits the instrument? *

YesNo


Number of Samples or Points to Analyse?


Please describe your analysis needs: *


Size of Area to be Analyzed?


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