Service Request

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We will get back to you as soon as we receive your request.
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First or Middle Name *

Last Name *

Company *

Profession *

E-mail Address *

Cell Phone / Work Phone Number *

Returning Customer *

YesNoYes - now at new company

How did you learn about us?

Work ColleagueWeb SearchTrade ShowYour BossA FriendAlready a Customer

How soon do you need results? *

Today<24 hr (1 business day)<48 hr (2 business days)<72 hr (3 business days)4-5 business days1-2 weeks

Type of Service Work Needed (may select more than 1) *

Atomic Absorption Spectroscopy (AAS)Atomic Force Microscopy (AFM)Auger Electron Spectroscopy (AES)Confocal Scanning Acoustic Microscopy (CSAM)Decapsulation (DECAP)Dye and Pry (DP)Electron Backscatter Diffraction (EBSD)Electron Energy Loss Spectroscopy (EELS)Energy Dispersive X-Ray Spectroscopy (EDS)Field Emission Scanning Electron Microscope (FESEM)Focused Ion Beam (FIB)Fourier Transform Infrared Spectroscopy (FTIR)Gas Chromatography Mass Spectrometry (GC-MS)Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES)Inductively Coupled Plasma Mass Spectroscopy (ICP-MS)Ion milling (IM)Magnetic Current Imaging (MCI)Optical Beam Induced Resistance Change (OBIRCH)Photon Emission Microscopy (PEM)Raman Spectroscopy (RAMAN)Reactive Ion Etching (RIE)Scanning Electron Microscopy (SEM)Scanning Transmission Electron Microscopy (STEM)Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)Transmission Electron Microscopy (TEM)X-Ray Photoelectron Spectroscopy(XPS)X-ray Diffraction Analysis (XRD)X-ray Fluorescence Analysis (XRF)2D/3D X-ray (X-Ray)Others ~ Please Specify below at the analysis needs

May we cut the sample to a size that fits the instrument? *


Number of Samples or Points to Analyse?

Please describe your analysis needs: *

Size of Area to be Analyzed?

You may upload your related information and photos here (20M Max)