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X-ray Diffraction Analysis (XRD) is a non-destructive analytical technique which can yield the unique definition of crystalline phases.  Minerals like alcite, dolomite gypsum, magnetite, hematite, portlandite, tobermorite can be analysed regardless of the colours. Since every crystal has a defined structure which is like human fingerprint, XRD can be used to characterised its structure.

• Phase composition determination
• Characterisation of doped cell structures for electro-ceramics
• Measurement of hard coating composition and structure e.g. carbides, nitrides on machine tools
• Characterisation of hydroxyapatite coatings on medical implant materials
• In-depth analysis of silicon wafers, ITO coated glasses and solar cells.


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