Atomic force microscopy (AFM) is a very high-resolution, high-sensitive type of scanning probe microscopy capable of quantifying surface roughness down to angstrom-scale. It can perform qualitative mapping of physical properties, like electric fields, adhesion layers, dopant distribution, conductivity region, Thinfilm layer etc.
|•Three-dimensional surface topographic imaging|
|•surface roughness, grain size, step height, and pitch|
|•Imaging of other sample characteristics, likes magnetic field, capacitance, friction, and phase.|
Our analysis method is accordance to international standard:
ASTM E2859 (Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy)