X-RAY FLUORESCENCE ANALYSIS — XRF

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Description

X-ray fluorescence (XRF) is the emission of characteristic “secondary” (or fluorescent) X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science and archaeology.

•Elemental analysis
•Chemical analysis

Rapid product and component screening for hazardous substances in accordance to global regulations such as RoHS, CPSIA, WEEE, EN71-3.

Our method can be traced to

ASTM F2617-08 (Standard Test Method for Identification and Quantification of Chromium, Bromine, Cadmium, Mercury, and Lead in Polymeric Material Using Energy Dispersive X-ray Spectrometry)

ASTM F963 (Standard Consumer Safety Specification for Toy Safety)

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